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MAP ATE For SoC |
MAP-RF (SG9000) ATE For RF Devices |
Test RD Center |
Test Technical |
Related Test |
Tester Platform |
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MAP SoC Test System
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MAP-RF (SG9000)
Features
Target Market with Successful Projects
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Technical support and customer service
Combining customer needs with decades of accumulated experience in test engineering and mass production,
We tailor-make the perfect testing solutions for our clients.
Mr. Wayne | Email: wayne@sigurd.com.tw


